Northrop Grumman has a staff of engineers and quality assurance personnel available for a wide range of technical consulting related to measurement and calibration. Consulting services range from the practical application of measurement theory and state of the art measurements to managing processes in the metrology environment.
NOTE: Measurements are NIST Traceable for parameters and frequencies supported by NIST.
For further information contact:
Steve Phleger
E-mail: steve.phleger@ngc.com
Phone: 800.227.5879
Fax: 310.814.8797
MIMIC On-Wafer Measurement
Northrop Grumman is one of the original founding members of the NIST MIMIC Consortium
Full noise parameter and S-parameter characterization from individual devices and on-wafer standards through multi-wafer automated testing
Manual Probe Capabilities
| Parameter Test Type |
Range |
| S-Parameter |
0.05 to 50 GHz
50 to 75 GHz and 75 to 110 GHz |
Noise Parameter
(fully characterized) |
2 to 40 GHz |
| Noise Figure |
1 to 50 GHz
50 to 75 GHz and 75 to 110 GHz |
Automated Probe Capabilities
| Parameter Test Type |
Range |
| S- Parameter |
0.05 to 110 GHz |
| PCM S-Parameter |
0.05 to 50 GHz |
| Pulsed S-Parameter |
26.5 to 40 GHz, 33 to 50 GHz,
50 to 75 GHz and 75 to 110 GHz |
| Noise Figure |
1 to 65 GHz |
| Load Pull |
26.5 to 40 GHz |
Scalar Measurements IP3, IP2h, Pout vs Pin,
Vout vs Pin, VCO Pout,
Multiplier Pout,
Conversion Gain |
1 to 65 GHz |
| Pulsed Scalar: Pout |
75 to 110 GHz |
Characterization/Special Measurement
| Parameter Test Type |
Range |
Phase Noise
One/Two Oscillator Technique |
50 MHz to 110 GHz |
| Network Analysis |
45 MHz to 110 GHz |
Power
(not directly NIST traceable) |
110 GHz to 180 GHz |
Training
| Courses may be customized per customer requirements. Course instructors are selected for their experience and practical knowledge in a given discipline |
Calibration/Measurement Techniques
Equipment Use/Limitations
Software/Instrument Control
HP VEE
National Instruments LabView
C
HP BASIC
Metrology
In-house and on-site metrology training services are available for a variety of disciplines |
System Development and Review
| Measurement Systems/Software |
| Calibration/test system design, measurement/test methodology review and development, and procedure/software generation |
| Calibration System Review and Development |
| Uncertainty analysis, policy documentation and compliance with ISO 9000, ANSI/NCSL Z540 |
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